ANSI/ASTM D3380-2003 塑料片基微波电路基片的相对透电率(介电常数)和耗散因数测试方法

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【英文标准名称】:TestMethodforRelativePermittivity(dielectricConstant)andDissipationFactorofPlastic-basedMicrowaveCircuitSubstrates
【原文标准名称】:塑料片基微波电路基片的相对透电率(介电常数)和耗散因数测试方法
【标准号】:ANSI/ASTMD3380-2003
【标准状态】:作废
【国别】:美国
【发布日期】:2003
【实施或试行日期】:2003-03-25
【发布单位】:美国国家标准学会(US-ANSI)
【起草单位】:ANSI
【标准类型】:()
【标准水平】:()
【中文主题词】:电气工程;试验;微波
【英文主题词】:Dielectricconstant;Dissipationfactor;Electricalengineering;Microwavecircuits;Microwaves;Plastics;Printedcircuits;Printed-circuitboards;Relativepermittivity;Testing
【摘要】:Thistestmethodpermitstherapidmeasurementofapparentrelativepermittivityandlosstangent(dissipationfactor)ofmetal-cladpolymer-basedcircuitsubstratesintheX-band(8to12.4GHz).ThistestmethodissuitablefortestingPTFE(polytetrafluorethylene)impregnatedglassclothorrandom-orientedfibermats,glassfiber-reinforcedpolystyrene,polyphenyleneoxide,irradiatedpolyethylene,andsimilarmaterialshavinganominalspecimenthicknessof1.6mm.Thematerialsareapplicabletoserviceatnominalfrequencyof9.6GHz.Note1-Seeforadditionalinformationaboutrangeofpermittivity,thicknessotherthan1.6mm,andtestsatfrequenciesotherthan9.6GHz.Thevaluesstatedininch-poundunitsaretoberegardedasthestandard.Thisstandarddoesnotpurporttoaddressallofthesafetyconcerns,ifany,associatedwithitsuse.Itistheresponsibilityoftheuserofthisstandardtoestablishappropriatesafetyandhealthpracticesanddeterminetheapplicabilityofregulatorylimitationspriortouse.
【中国标准分类号】:L40
【国际标准分类号】:31_180
【页数】:
【正文语种】:英语